TY - JOUR T1 - Avalanche noise characteristics in submicron InP diodes JO - IEEE J QUANTUM ELECT PY - 2008/03/01 AU - Tan LJJ AU - Ng JS AU - Tan CH AU - David JPR ED - DO - DOI: 10.1109/JQE.2007.914771 VL - 44 IS - 3-4 SP - 378 EP - 382 Y2 - 2025/05/31 ER -