@inproceedings{inproceedings, title = {{The Cause of Subthreshold Leakage Currents Induced by Nucleons and Ions in Power MOSFETs}}, publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}}, url = {{http://dx.doi.org/10.1109/tns.2013.2246870 }}, year = {{2013}}, month = {{3}}, author = {{Chugg AM and Parker S and Duncan and Barber TS and Hands A and Morris P and Poivey C}}, doi = {{10.1109/tns.2013.2246870}}, volume = {{60}}, journal = {{IEEE Transactions on Nuclear Science}}, issue = {{4}}, pages = {{2530-2536}}, note = {{Accessed on 2025/05/28}}}