TY - JOUR T1 - Influence of mobility model on extraction of stress dependent source-drain series resistance JO - Microelectronics Reliability PY - 2004/01/01 AU - De Souza MM AU - Manhas SK AU - Chandra Sekhar D AU - Oates AS AU - Chaparala P ED - DO - DOI: 10.1016/j.microrel.2003.09.005 VL - 44 IS - 1 SP - 25 EP - 32 Y2 - 2025/05/17 ER -