TY - JOUR T1 - Data BER analysis of OAM-assisted physical layer authentication system JO - IEICE Electronics Express UR - http://dx.doi.org/10.1587/elex.19.20220434 PY - 2022/12/10 AU - Hu T AU - Zhang B AU - Zhao K AU - Wang Y AU - Zhang J ED - DO - DOI: 10.1587/elex.19.20220434 PB - Institute of Electronics, Information and Communications Engineers (IEICE) VL - 19 IS - 23 SP - 20220434 EP - 20220434 Y2 - 2025/05/30 ER -