TY - JOUR T1 - Scanning transmission electron microscopy measurement of bismuth segregation in thin Ga(As,Bi) layers grown by molecular beam epitaxy JO - Crystal Research and Technology UR - http://eprints.whiterose.ac.uk/91479/ PY - 2014/07/03 AU - Walther T AU - Richards RD AU - Bastiman F ED - DO - DOI: 10.1002/crat.201400157 PB - Wiley VL - 50 IS - 1 SP - 38 EP - 42 Y2 - 2025/05/24 ER -