TY - JOUR T1 - Knowledge-Enhanced Spatiotemporal Analysis for Anomaly Detection in Process Manufacturing JO - Computers in Industry UR - http://dx.doi.org/10.1016/j.compind.2024.104111 PY - 2024/10/01 AU - Allen L AU - Lu H AU - Cordiner J ED - DO - DOI: 10.1016/j.compind.2024.104111 PB - Elsevier BV VL - 161 SP - 104111 EP - 104111 Y2 - 2025/07/06 ER -