TY - JOUR T1 - Multiplication and excess noise characteristics of thin 4H-SiC UV avalanche photodiodes JO - IEEE PHOTONIC TECH L UR - http://eprints.whiterose.ac.uk/902/ PY - 2002/09/01 AU - Ng BK AU - Yan F AU - David JPR AU - Tozer RC AU - Rees GJ AU - Qin C AU - Zhao JH ED - DO - DOI: 10.1109/LPT.2002.801112 VL - 14 IS - 9 SP - 1342 EP - 1344 Y2 - 2025/05/20 ER -