@article{article, title = {{Characterisation of series resistance degradation through charge pumping technique}}, url = {{}}, year = {{2003}}, month = {{4}}, author = {{Manhas SK and Sehkar DC and Oates AS and De Souza MM}}, doi = {{10.1016/S0026-2714(03)00017-9}}, volume = {{43}}, journal = {{MICROELECTRONICS RELIABILITY}}, issue = {{4}}, pages = {{617-624}}, note = {{Accessed on 2025/05/29}}}