TY - JOUR T1 - Relating the Experimental Ionization Coefficients in Semiconductors to the Nonlocal Ionization Coefficients JO - IEEE Transactions on Electron Devices PY - 2015/04/27 AU - Jeng Shiuh Cheong AU - Hayat MM AU - Xinxin Zhou AU - David JPR ED - DO - DOI: 10.1109/ted.2015.2422789 PB - Institute of Electrical and Electronics Engineers (IEEE) VL - 62 IS - 6 SP - 1946 EP - 1952 Y2 - 2025/05/28 ER -