TY - CONF T1 - Log-based slicing for system-level test cases JO - Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis PY - 2021/07/11 AU - Messaoudi S AU - Shin D AU - Panichella A AU - Bianculli D AU - Briand LC ED - DO - DOI: 10.1145/3460319.3464824 PB - ACM Y2 - 2025/05/24 ER -