TY - JOUR T1 - XCT analysis of the influence of melt strategies on defect population in Ti鈥�6Al鈥�4V components manufactured by Selective Electron Beam Melting JO - Materials Characterization PY - 2015/04/01 AU - Tammas-Williams S AU - Zhao H AU - L茅onard F AU - Derguti F AU - Todd I AU - Prangnell PB ED - DO - DOI: 10.1016/j.matchar.2015.02.008 PB - Elsevier BV VL - 102 SP - 47 EP - 61 Y2 - 2025/07/15 ER -