TY - JOUR T1 - A Practical Guide to Optical Metrology for Thin Films, by Michael Quinten JO - Contemporary Physics PY - 2013/09/01 AU - Fox M ED - DO - DOI: 10.1080/00107514.2013.835351 PB - Informa UK Limited VL - 54 IS - 5 SP - 255 EP - 255 Y2 - 2025/05/28 ER -