TY - CONF T1 - Comparison of multilayered nanowire imaging by SEM and Helium Ion Microscopy JO - ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009) PY - 2010/01/01 AU - Inkson BJ AU - Liu X AU - Peng Y AU - Jepson MAE AU - Rodenburg C ED - Baker RT DO - DOI: 10.1088/1742-6596/241/1/012080 VL - 241 Y2 - 2025/05/24 ER -