@inproceedings{inproceedings, title = {{Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope}}, publisher = {{IOP Publishing}}, url = {{https://eprints.whiterose.ac.uk/164366/ }}, year = {{2020}}, month = {{8}}, author = {{Trager-Cowan C and Alasmari A and Avis W and Bruckbauer J and Edwards PR and Hourahine B and Kraeusel S and Kusch G and Jablon BM and Johnston R and Martin RW et al}}, doi = {{10.1088/1757-899x/891/1/012023}}, volume = {{891}}, journal = {{IOP Conference Series: Materials Science and Engineering}}, note = {{Accessed on 2025/05/24}}}